##### AM-07 - Point pattern analysis

- List the conditions that make point pattern analysis a suitable process
- Identify the various ways point patterns may be described
- Identify various types of K-function analysis
- Describe how Independent Random Process/Chi-Squared Result (IRP/CSR) may be used to make statistical statements about point patterns
- Outline measures of pattern based on first and second order properties such as the mean center and standard distance, quadrat counts, nearest neighbor distance, and the more modern G, F, and K functions
- Outline the basis of classic critiques of spatial statistical analysis in the context of point pattern analysis
- Explain how distance-based methods of point pattern measurement can be derived from a distance matrix
- Explain how proximity polygons (e.g., Thiessen polygons) may be used to describe point patterns
- Explain how the K function provides a scale-dependent measure of dispersion
- Compute measures of overall dispersion and clustering of point datasets using nearest neighbor distance statistics

## AM-38 - Pattern recognition